Please note that Internet Explorer is incompatible with this site.

We recommend upgrading to the latest Microsoft Edge, Google Chrome, or Firefox.

Skip to Main Content

Core Facilities


JEOL JSM6490 Scanning Electron Microscope

Supports ultrastructural analyses of surfaces and 3D organization. A high-performance scanning electron microscope with 3.0 nm resolution. It has secondary and backscatter detectors, low vacuum mode as well as an EDAX Genesis energy-dispersive x-ray analysis system for elemental analysis.